Schedule Download: The program  Lectures› Sébastien Gauthier (CEMES Toulouse) --- abstract --- slides Principles of nc-AFM › Ralf Bechstein (Gutenberg University Mainz) --- abstract --- slides Contrast formation in nc-AFM › Michael Reichling (University of Osnabrück) --- abstract --- slides Noise limits in nc-AFM › Franz Giessibl (University of Regensburg) --- abstract --- slides (updated, 2013-10-15) QPlus sensor enables combined STM/AFM, measuring manipulation forces and extremely high resolution › Leo Gross (IBM Research Zurich) --- abstract --- slides Individual Molecules Investigated by Scanning Probe Microscopy with Atomically Functionalized Tips › Philipp Rahe (University of Utah, Salt Lake City) --- abstract --- slides Force mapping and single-electron tunneling using NC-AFM › Jürgen Köble (Omicron NanoScience, Frankfurt) --- abstract --- slides (updated, 2013-10-15) Preparing, Conducting and Customizing UHV nc-AFM experiments from Scratch
› Adam Foster (Aalto University, Helsinki) --- abstract --- slides Simulating Scanning Probe Microscopy › Alexander Schwarz (University of Hamburg) --- abstract --- slides Magnetic sensitive force microscopy › Thierry Mélin (IEMN Lille) --- abstract --- slides Principles of Electrostatic force microscopy and applications › Laurent Nony (IM2NP Marseille) --- abstract --- slides Principles of KPFM and applications › Benjamin Grévin (CEA-CNRS-UJF Grenoble) --- abstract --- slides nc-AFM and KPFM applied to materials in organic electronics and photo-voltaic › Philipp Rahe (University of Utah, Salt Lake City) --- slides (updated, 2013-10-15) Gwyddion - a modular programme for SPM data visualisation and analysis All abstracts All slides Oral and poster presentations of PHD students and postdocsOral + poster presentationsMonday
1
D. S. Wastl,
A. J. Weymouth, and F. J. Giessibl
2
V.
Pukhova, F. Banfi and
G. Ferrini
3
C. Büchner,
S. Stuckenholz, M. Heyde, H.-J. Freund
5 M. Temmen, O. Ochedowski, M. Schleberger, M. Reichling, T. R. J. Bollmann Hydration layers on CaF2 (111) trapped by mechanically exfoliated graphene Fachbereich Physik, Universität Osnabrück (Germany) and
Fakultät für Physik and CeNIDE, Universität Duisburg-Essen
(Germany) 6
J. Dupré de
Baubigny, J. Buchoux, M. Delmas, M. Legros, J.-P.
Aimé and T. Ondarçuhu
Tuesday
1
A. Amrous,
F. Bocquet, L. Nony, F. Para, and Ch. Loppacher, S.
Lamare, F. Palmino, and F. Cherioux, D. Z. Gao, M. B.
Wattkins, and A. L. Shluger
2
B.
Hoff, M. Gingras, R. Perresutti, G. Félix, C. R.
Henry, A. S. Foster and C. Barth
3
R. Lindner,
P. Rahe, M. Kittelmann, A. Gourdon, R. Bechstein, and A.
Kühnle
4
C.
Lotze, M. Corso,
Jingcheng Li, G. Schulze, K.
J. Franke and J. I. Pascual
5
F. Schulz, Ch. Lotze,
M. Corso, P. Liljeroth, K. J.
Franke and N. Pascual
KPFM study of model donor-acceptor self-assemblies for organic photovoltaics CEA-INAC SPrAM (CEA-CNRS-UJF), Grenoble (France) and Department of Computational Physics, IFM, Linköping University (Sweden) Poster presentations1 I. Beinik, S. Porsgaard and J. V. Lauritsen The interaction of water with a model Cu/ZnO catalyst Interdisciplinary Nanoscience Center (iNANO), Aarhus University (Denmark) 2 A. Bubendorf, Ch. Werle, A. Tonin, H.R. Hidber, D. Brändlin, S. Kawai, Th. Glatzel and E. Meyer Multi-PLL detection system for high resolution scanning probe microscopy Department of Physics, University of Basel (Switzerland) and Nanosurf AG, Liestal (Switzerland) 3 S. Girod, J.-L. Bubendorf, F. Montaigne, L. Simon, D. Lacour and M. Hehn Real time atomic force microscopy imaging for nano contact fabrication by electromigration Institut Jean Lamour, Université de Lorraine, Vandœuvre les Nancy (France) and Institut de Science des Matériaux de Mulhouse (IS2M), Université de Haute Alsace, Mulhouse (France) 4 N. Guillaume, E. Puyoo, D. Albertini, N.Baboux, M. Le Berre, B. Gautier, F. Calmon Use of Atomic Force Microscopy towards the Development of Nano Devices by Fabricating Oxide Patterns on Titanium thin Film Lyon Institute of Nanotechnology (INL), University of Lyon, Villeurbanne (France) 5 F. Huber, A. J. Weymouth and F. J. Giessibl Dynamic determination of κ at the atomic scale Institute of Experimental and Applied Physics, University of Regensburg (Germany) 6 A. Köhler, A. Schwarz and R. Wiesendanger CO adsorbed on Mn/W(001) Institut für Angewandte Physik, Universität Hamburg (Germany) 7 S. Matencio, C. Ocal and E. Barrena Study of copper oxide by STM and nc-AFM Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Bellaterra (Spain) 8 M. Mirkowska, M. Kratzer, C. Teichert and H. Flachberger Charging behavior of the calcite (100) surface investigated by KPFM Department of Mineral Resources and Petroleum Engineering, Montanuniversität Leoben (Austria) and Institute of Physics, Montanuniversität Leoben (Austria) 9 A. J. Weymouth, D. Meuer, P. Mutombo, T. Wutscher, M. Ondráček, P. Jelinek and F. J. Giessibl Atomic Structure Affects the Directional Dependence of Friction Institute of Experimental and Applied Physics, University of Regensburg (Germany) and Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovanicka (Czech Republic) 10 R. Olbrich, H. H. Pieper, H. Wilkens, R. Oelke, J. Wollschläger, M. Zoellner, T. Schroeder and M. Reichling NC-AFM surface study of ceria grown on Si(111) Fachbereich Physik, Universität Osnabrück (Germany) and IHP, Frankfurt (Oder) (Germany) 11 P. Olszowski, J. Prauzner-Bechcicki, Sz. Godlewski, Ivo Starý, Irena G. Stará, B. Such and M. Szymoński Growth and organization of QUAD molecules on KBr Institute of Physics, Jagiellonian University Krakow (Poland) and Institute of Organic Chemistry and Biochemistry, Prague (Czech Republic) 12 R. Pawlak, E. Gnecco, S. Kawai, T. Glatzel, S. Fremy, H. Fang, L.-A. Fendt, F. Diederich, A. Baratoff, E. Meyer Atomic-scale friction sensed by a single organic molecule Departement of Physics, University of Basel (Switzerland) and Instituto Madrileno de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Cantoblanco Madrid (Spain) and Laboratory of Organic Chemistry, Department of Chemistry and Applied Biosciences, ETH Zürich (Switzerland) 13 K. Ruschmeier, H. von Allwörden, A. Schwarz and R. Wiesendanger A high resolution UHV - 300mK – 10T - Atomic Force Microscope Universität Hamburg, Institut für Angewandte Physik, Hamburg (Germany) 14 J. van der Lit, M.P. Boneschanscher, M. Ijäs, A. Harju, P. Liljeroth, D. Vanmaekelbergh and I. Swart The atomic and electronic structure of well-defined graphene nanoribbons studied by scanning probe microscopy Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University (The Netherlands) and Department of Applied Physics, Aalto University School of Science (Finland) 15 D. S. Wastl, F. Speck, E. Wutscher, M. Ostler, T. Seyller and F. J. Giessibl Observation of 4 nm-Pitch Stripe Domains Formed by Exposing Graphene to Ambient Air Institut für experimentelle und angewandte Physik, Universität Regensburg (Germany) and Lehrstuhl für Technische Physik, Universität Erlangen-Nürnberg (Germany) and Institut für Physik, Technische Universität Chemnitz (Germany) 16 S. Zint, J. Hilk, J. Falter, D. Dietzel, and A. Schirmeisen Reconstruction of field ion microscopy characterized tungsten tips at the atomic level Institute of Applied Physics , JLU Giessen (Germany) and TransMIT-Center of Adaptive Cryotechnology and Sensors, Giessen (Germany) |
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